Thammaiah, Chethana Hadya, JSS Science & Technology University, India

• Vol 10, No 3: December 2021 - Information Technology & Communication Engineering
  An approach to partial occlusion using deep metric learning
  Abstract  PDF

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The International Journal of Informatics and Communication Technology (IJ-ICT)
p-ISSN 2252-8776, e-ISSN 2722-2616
This journal is published by the Institute of Advanced Engineering and Science (IAES) in collaboration with Intelektual Pustaka Media Utama (IPMU).